open access publication

Article, Early Access, 2024

Quantitative gas-phase transmission electron microscopy: Where are we now and what comes next?

MRS BULLETIN, ISSN 0883-7694, 0883-7694, 10.1557/s43577-023-00648-8

Contributors

Jinschek, Joerg R. (Corresponding author) [1] Helveg, Stig [1] Allard, Lawrence F. [2] [3] Dionne, Jennifer A. [4] Zhu, Yuanyuan [5] Crozier, Peter A. (Corresponding author) [6] [7]

Affiliations

  1. [1] Tech Univ Denmark, Ctr Visualizing Catalyt Proc VISION, Dept Phys, Lyngby, Denmark
  2. [NORA names: DTU Technical University of Denmark; University; Denmark; Europe, EU; Nordic; OECD];
  3. [2] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN USA
  4. [NORA names: United States; America, North; OECD];
  5. [3] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN USA
  6. [NORA names: United States; America, North; OECD];
  7. [4] Stanford Univ, Mat Sci & Engn, Stanford, CA USA
  8. [NORA names: United States; America, North; OECD];
  9. [5] Univ Connecticut, Dept Mat Sci & Engn MSE, Storrs, CT USA
  10. [NORA names: United States; America, North; OECD];

Abstract

Based on historical developments and the current state of the art in gas-phase transmission electron microscopy (GP-TEM), we provide a perspective covering exciting new technologies and methodologies of relevance for chemical and surface sciences. Considering thermal and photochemical reaction environments, we emphasize the benefit of implementing gas cells, quantitative TEM approaches using sensitive detection for structured electron illumination (in space and time) and data denoising, optical excitation, and data mining using autonomous machine learning techniques. These emerging advances open new ways to accelerate discoveries in chemical and surface sciences.

Keywords

Beam effects, Catalysis, Data analysis, Denoising, Electron energy-loss spectroscopy (EELS), Environmental transmission electron microscopy (ETEM), Gas phase, In situ, Low dose, Machine learning, Nanoreactor, Operando, Surface, Transmission electron microscopy (TEM)

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